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This article in AJ

  1. Vol. 57 No. 3, p. 241-244
     

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doi:10.2134/agronj1965.00021962005700030003x

An Exponential Model for Predicting Optimum Plant Density and Maximum Corn Yield1

  1. S. G. Carmer and
  2. J. A. Jackobs2

Synopsis

Synopsis

The relationship between yield of corn, Y, and plant density, N, per unit area may be depicted as Y = NAKN. Methods of estimating the parameters A and K and optimum density, Nopt, and maximum yield, Ymax, are presented. Data from a yield trial of 8 single cross hybrids at 4 densities are used to illustrate the usefulness of the model.

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