Growth Response of Corn to Changes in Root Temperature and Soil Water Suction Measured with an LVDT1
- E. W. R. Barlow and
- L. Boersma2
The rate of corn (Zea mays L.) leaf elongation was continuously monitored with a Linear Variable Differential Transducer (LVDT) which accurately measures the rapid changes in leaf elongation rate that occur after a plant is released from stress. Short-term measurements of leaf elongation rate at varying root temperatures gave qualitatively similar results to those obtained by other workers in long-term experiments. The leaf elongation rate increased rapidly when plant roots were released from low temperature or water stress. The maximum leaf elongation rate achieved after the the release from stress was higher than the maximum rate of unstressed plants.Please view the pdf by using the Full Text (PDF) link under 'View' to the left.
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