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Crop Science Abstract -

Effectiveness of Early-generation Yield Selection of Heterogeneous Lines in Soybeans1


This article in CS

  1. Vol. 15 No. 3, p. 313-315
    Received: Apr 26, 1974

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  1. H. R. Boerma and
  2. R. L. Cooper2



F2−derived, heterogenous soybean [Glycine max (L.) Merr.] lines (HL) were selected for high seed yield by the early-generation yield-testing procedure (EGT), based on F3, F3−F4, and F3−F4−F5 combined generation means in four soybean crosses. Pure lines (PL) were selected for high seed yield from these same four crosses by the pedigree selection (PS) and single-seed-descent (SSD) procedures.

Selection of superior-yielding HL in the F3, F4, and F5 generations decreased the coefficient of genetic variability in each generation of selection. The yield performance of the selected HL in the 1970 uniform preliminary test II also suggested that the HL were uniform among lines in yielding ability and the HL from one cross were equal in yield to the reference varieties.

The results indicated that in one of the four crosses PL selected by the SSD procedure were significantly higher in yield and earlier in maturity than the HL. In the other crosses, no significant yield differences existed between PL and HL, although the PL were usually earlier in maturity than the HL. These results suggested that pure lines from a cross will be equal to or higher in yield than F2−derived heterogeneous lines.

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