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Crop Science Abstract -

Factors Determining Flag Leaf Curvature in Wheat1

 

This article in CS

  1. Vol. 22 No. 3, p. 617-622
     
    Received: June 22, 1981


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doi:10.2135/cropsci1982.0011183X002200030045x
  1. J.-F. Ledent and
  2. CH. Renard2

Abstract

Abstract

Flag leaf curvature is a major aspect of canopy configuration. A knowledge of factors determining its occurrence might be important for understanding yield. Effects of genotypes and N application on the proportion of straight (S) and curved (C) flag leaves were, therefore, investigated. The two types of flag leaves were also compared for characters expected to affect curvature: leaf size, internal leaf structure (anatomy, chemical analysis of cell wall material), water status and N content.

Most genotypes displayed both straight and curved flag leaves. The proportion varied greatly with N treatment and genotype. Curved leaves were longer and wider and were associated with higher tillering. There was no clear relation with cell wall material or sclerenchyma content. The midrib along was unable to maintain leaf rigidity. In detached leaves water status affected markedly leaf curvature, but in intact plants there was no significant difference in water status between C and S leaves. In the material tested, higher yielding varieties tended to display a greater number of straight flag leaves.

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