About Us | Help Videos | Contact Us | Subscriptions
 

Abstract

 

This article in CS

  1. Vol. 22 No. 4, p. 712-716
     
    Received: Nov 20, 1980


 View
 Download
 Alerts
 Permissions
Request Permissions
 Share

doi:10.2135/cropsci1982.0011183X002200040004x

Association of Volatile Aldehyde Production During Germination with Poor Soybean and Pea Seed Quality1

  1. G.E. Harman,
  2. B. L. Nedrow,
  3. B.E. Clark and
  4. L. R. Mattick2

Abstract

Abstract

We compared production of volatile aldehyde compounds (VACs) with seed quality as measured by field performance and laboratory germination of groups of selected soybean and pea seed lots. In 1978, we tested a group of four soybean (Glycine max. L.) lots with high levels of seedborne pathogens, particularly Phomopsis sojae Leh.; in 1979 a group of eight soybean lots with low levels of pathogens and high laboratory germination, and also a group of five sublots of pea (Pisum sativum L.) seeds that had been artificially aged (30C and 92% relative humidity for up to 10 weeks) in the presence and absence of storage fungi; and in 1980 ten lots of soybean seed that differed in amounts of seedborne pathogens and in laboratory germination. We found that seedborne microorganisms decreased the amount of VAC production, necessitating a benomyl plus thiram seed treatment before testing VAC levels. VAC production was up to 30-fold higher in aged than in unaged pea seed lots and 3 to 7-fold greater in poor than in high-quality soybean seed lots. In. all years, there was a significant correlation between field emergence of fungicide-treated seeds and VAC production. Correlations between field emergence of nontreated seeds and VAC production were not always significant at the 5% level, but r values were either large or higher than r values of correlations between laboratory germination and field emergence. VAC production is abundant in seed lots of poor quality and may be a useful measure of seed vigor.

  Please view the pdf by using the Full Text (PDF) link under 'View' to the left.

Copyright © .