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This article in CS

  1. Vol. 22 No. 4, p. 771-773
    Received: Apr 27, 1981

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Genetics of Host Plant Resistance of Wheat to Septoria nodorum1

  1. L. R. Nelson and
  2. C. E. Gates2



F1 progeny from diallel crosses (reciprocals included) among five wheat (Triticum aestivum L.) cultivars were tested in the greenhouse for reaction to infection by Leptosphaeria nodorum Muller [imperfect stage = Septoria nodorum (Berk.) Berk.], the cause of glume blotch. In a separate experiment, four wheat parents and all F1, F2, and backcrosses were likewise tested for reaction to the pathogen. Significant effects were found for additive, dominance, and additive ✕ additive genetic effects as well as heterosis. Cultivars with the additive type resistance were ‘Oasis’ and ‘Blueboy II’ in Exp. I and Oasis in Exp. II. Crosses involving ‘McNalr 1813’, a susceptible parent, demonstrated heterosis for a more resistant reaction. These results indicate that resistance to S. nodorura is inherited in a very complex manner and that several genes may be involved.

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