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Crop Science Abstract -

Mapping Genes Conferring and Suppressing Leaf Rust Resistance in Wheat


This article in CS

  1. Vol. 37 No. 6, p. 1928-1935
    Received: Dec 23, 1996

    * Corresponding author(s): mes12@cornell.edu
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  1. J. C. Nelson *,
  2. R. P. Singh,
  3. J. E. Autrique and
  4. M. E. Sorrells*
  1. Dep. of Plant Breeding and Biometry, 252 Emerson Hall, Corneal Univ., Ithaca, NY 14853, USA
    Wheat Program, International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, 06600 Mexico, D.F., Mexico



Leaf rust, caused by Puccinia recondita Roberge ex Desmaz. f. sp. tritici Eriks. & E. Henn., is a serious disease of wheat (Triticum aestivum L.) worldwide. We evaluated leaf rust resistance in a RFLP-mapping population of wheat inbred lines developed from a synthetic [T. turgidum L. × T. touschii (Coss.) Schmal.] × T. aestivum cross, using inoculation trials performed on seedlings and adult plants. Map locations were assigned for seedling resistance genes LrI0 (chromosome arm 1AS), Lr23 (2BS), Lr27 (3BS), and Lr31 (4BL), and the adult-plant resistance gene Lr34 (7DS). The previously reported interaction between Lr27 and Lr31, requiring the presence of both genes for resistance to avirulent rust pathotypes, was confirmed. Lr23, effective in the durum parent (‘Altar 84’) of the synthetic, was suppressed in the synthetic and in one fourth of the inbred lines by a T. tauschii gene on homoeologous chromosome arm 2DS. This suppressor, designated as SuLr23, appears to be specific for Lr23 and may be orthologous to the gene. DNA markers are useful in refining the characterization of resistance genes and their interactions, toward the goal of constructing durably resistant cultivars via marker-controlled accumulation of specific genes.

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